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Congratulations to Dr. Liou

April 23, 2014

Dr. Juin J. Liou received $600,000 from Analog Devices Inc. for his innovative research on the subject of electrostatic discharge (ESD) protection. His project, entitled “Failure Criteria Metric under ESD Stress Conditions” focuses on developing and implementing novel and effective methodologies for determining the safe operating regions of semiconductor devices and integrated circuits under different ESD stresses.
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